A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

Charongrattanasakul, Pramote; Bamrungsetthapong, Wimonmas; Kumam, Poom

doi:10.32604/cmc.2022.030856

Cited by 2 publications

(4 citation statements)

References 25 publications

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“…The Weibull distribution is often employed in statistical quality control studies [16][17][18][19]28]. Because of its flexibility and closed shape, the Weibull distribution serves as the most popular choice to model the data lifespan.…”

Section: Weibull Distributionmentioning

confidence: 99%

“…Since the acceptance or rejection of current lots depends on previous and current lots, the MDS sampling plan is intended for a continuous production process whereby lots are sent for serial inspection, which reduces the sample size. Several researchers have adopted MDS sampling plans to develop a more efficient acceptance sampling plan [16][17][18][19]. Many researchers created designs to apply MDS sampling in the area of control charts, such as Aslam et al [20] who provided the X chart using MDS sampling based on a double control limit.…”

Section: Introductionmentioning

confidence: 99%

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Modified DS <i>np</i> Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

Bamrungsetthapong,

Charongrattanasakul

2024

CMES

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This study presents the design of a modified attributed control chart based on a double sampling (DS) np chart applied in combination with generalized multiple dependent state (GMDS) sampling to monitor the mean life of the product based on the time truncated life test employing the Weibull distribution. The control chart developed supports the examination of the mean lifespan variation for a particular product in the process of manufacturing. Three control limit levels are used: the warning control limit, inner control limit, and outer control limit. Together, they enhance the capability for variation detection. A genetic algorithm can be used for optimization during the in-control process, whereby the optimal parameters can be established for the proposed control chart. The control chart performance is assessed using the average run length, while the influence of the model parameters upon the control chart solution is assessed via sensitivity analysis based on an orthogonal experimental design with multiple linear regression. A comparative study was conducted based on the out-of-control average run length, in which the developed control chart offered greater sensitivity in the detection of process shifts while making use of smaller samples on average than is the case for existing control charts. Finally, to exhibit the utility of the developed control chart, this paper presents its application using simulated data with parameters drawn from the real set of data.

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Section: Weibull Distributionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Modified DS <i>np</i> Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

Bamrungsetthapong,

Charongrattanasakul

2024

CMES

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“…Third component: Let C E be the cost of external failure for each lot of products, as shown in Eq. (16).…”

Section: Economic Design Of An Amdssp For the Accelerated Life Testmentioning

confidence: 99%

“…The mean lifetime of products using a GMDSSP was investigated by Aslam et al [14] for the gamma, Burr type XII and Birnbaum-Saunders distributions, while Aslam et al [15] developed the MMDSSP, a modified version of the MDSSP that they claimed was more adaptable and effective than the existing MDSSP in terms of sample size and inspection cost over time truncated life. Charongrattanasakul et al [16] proposed a novel adaptive version of the MDSSP that accepted the current lot if the quality of the product was excellent, good or moderate, while existing sampling plans only operated at two levels. They claimed that their proposed sampling plan was more flexible and efficient in terms of average sample number than the MDSSP and MMDSP.…”

Section: Introductionmentioning

confidence: 99%

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

Charongrattanasakul¹,

Bamrungsetthapong²,

Kumam³

2023

Computer Systems Science and Engineering

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A novel adaptive multiple dependent state sampling plan (AMDSSP) was designed to inspect products from a continuous manufacturing process under the accelerated life test (ALT) using both double sampling plan (DSP) and multiple dependent state sampling plan (MDSSP) concepts. Under accelerated conditions, the lifetime of a product follows the Weibull distribution with a known shape parameter, while the scale parameter can be determined using the acceleration factor (AF). The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive. An economic design of the proposed sampling plan was also considered for the ALT. A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number (ASN) and total cost of inspection (TC) under both producer's and consumer's risks. Numerical results are presented to support the AMDSSP for the ALT, while performance comparisons between the AMDSSP, the MDSSP and a single sampling plan (SSP) for the ALT are discussed. Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions. The AMDSSP also had a higher operating characteristic (OC) curve than both the existing sampling plans. Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan.

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A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

Cited by 2 publications

References 25 publications

Modified DS <i>np</i> Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

Modified DS <i>np</i> Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

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