A novel fiber-fretting test for tribological characterization of the fiber/matrix interface

From pulsed-DCMS and HiPIMS to microwave plasma-assisted sputtering: Their influence on the properties of diamond-like carbon films

“…8) showed a broadening effect with increasing substrate bias. The broadening effect results from a higher level of disorder within the amorphous structure [56] of the fabricated DLC films. When considering the amorphization trajectory from graphite to tetrahedral amorphous carbon, there are many possible intermediate configurations of carbon atoms (rings, partial rings, chains) [57] that may occur and cannot be determined with certainty.…”

Fabrication process and growth mechanism of novel micro‐stack PyC interphase with different textures

“…The (002) plane lattice fringes of PyC slices were photographed by TEM (FEI Talos‐F200S). The OA value, obtained by the method in the reference, 22 was the criteria to accurately distinguish the texture types of PyC. The nanoindentation experiments were performed on a Bruker Hysitron TI980, using the standard Berkovich indenter.…”

Interfacial Fracture Behavior and Adhesive Strength in Tensile and Shear Loading of SiC-PyC-SiC Composites by Micro-Scale Specimens

“…Numerous studies emphasize the importance of the determination of local debonding shear strength and fracture toughness analysis. Advantages of the fiber pull-out and push-out techniques are the direct assessment of tribological properties of the interlayer, its classification into cohesive or adhesive type and determination of shear strength [17][18][19][20][21][22][23]. A more thorough but generally less statistical approach to overcome disadvantages of the fiber push-out method is achieved by focused ion beam (FIB) produced micropillars [24][25][26].…”