Abstract:<p>In this paper we propose a new evaluation method for revealing the inner structure information from the measurements of the thermal transient response of semiconductor devices. In contrast with the conventional methods based on the frequency domain deconvolution, the proposed method casts the problem as a regularized least squares problem for an integral equation directly in the time domain. The regularization is selected based on the knowledge of certain physical quantities involved in the measuremen… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.