2019
DOI: 10.1039/c9nr02213a
|View full text |Cite
|
Sign up to set email alerts
|

A novel approach to finding mechanical properties of nanocrystal layers

Abstract: The onset of bifurcations during bending is used to estimate the shear modulus of silicon nanocrystal layers on PDMS.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
14
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 12 publications
(15 citation statements)
references
References 58 publications
0
14
0
Order By: Relevance
“…SiNCs were produced using a nonthermal plasma technique, as reported previously and described in the Experimental Section. [ 14,16,17,37 ] We characterized the SiNCs using X‐ray diffraction (XRD) and transmission electron microscopy (TEM) ( Figure ).…”
Section: Resultsmentioning
confidence: 99%
See 4 more Smart Citations
“…SiNCs were produced using a nonthermal plasma technique, as reported previously and described in the Experimental Section. [ 14,16,17,37 ] We characterized the SiNCs using X‐ray diffraction (XRD) and transmission electron microscopy (TEM) ( Figure ).…”
Section: Resultsmentioning
confidence: 99%
“…The average size of a single SiNC was estimated using TEM image analysis to be ≈4 nm in diameter and confirmed to be ≈3.7 nm using Scherrer broadening analysis of the XRD peaks. [ 17,38 ]…”
Section: Resultsmentioning
confidence: 99%
See 3 more Smart Citations