A new X-ray beam induced current setup, coupled with X-ray diffraction imaging, for diamonds and semiconductors characterization by synchrotron techniques at ESRF

Lafont, F.; Baruchel, J.; Bousquet, J.; Capria, E.; Celestre, R.; Cotte, M.; Dauvergne, D.; Everaere, P.; Gallin-Martel, M.L.; Hoarau, C.; Ibourk, O.; Letellier, J.; Molle, R.; Muraz, J.-F.; Nusimovici, D.Z.; Reynaud, M.; Tran-Caliste, T.N.

doi:10.1016/j.diamond.2023.110454

Diamond and Related Materials

2023

DOI: 10.1016/j.diamond.2023.110454

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A new X-ray beam induced current setup, coupled with X-ray diffraction imaging, for diamonds and semiconductors characterization by synchrotron techniques at ESRF

F. Lafont,

J. Baruchel,

J. Bousquet

et al.

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A new X-ray beam induced current setup, coupled with X-ray diffraction imaging, for diamonds and semiconductors characterization by synchrotron techniques at ESRF

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References 16 publications

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