A new universal calibration method for four-terminal-pair admittance standards

Suzuki, K.; Aoki, T.; Yokoi, K.

doi:10.1109/cpem.1990.109904

Cited by 8 publications

(15 citation statements)

References 1 publication

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“…l(b). The calculated correction for the additional 13 cm cable lengths up to 1 MHz is approximately 100 ppm, whereas the data in Fig. 1(b) shows a difference at 1 MHIz of 300 ppm.…”

Section: Hf Capacitance Measurementsmentioning

confidence: 79%

“…From the above definitions ox=,=0 at 1.592kHz. The lnF capacitance and 100Q2 resistance standards can then be compared in a two terminal-pair (2TP) quadrature bridge at 1.592 MHz, such that: (2f)C(f)R(f) = (2irf)CORO(l+a +p) = +y (1) assuming (a,c and y <<l) and y is the relative voltage injected to balance the quadrature bridge. Simplifying equation (1) gives a+f-y = A, which establishes closure of the MIT to an accuracy 'A' (a dimensionless quantity which would be zero for a perfect closure of the MIT).…”

Section: Closure Of Metrological Imdedance Triangle (Mit)mentioning

confidence: 99%

“…Several groups world-wide are currently engaged in accurate characterization of the frequency dependence of capacitance and resistance standards in order, ultimately, to provide the LCR and impedance analyzer (IA) instrument manufacturers with calibrations at frequencies other than 1 kHz [1][2][3][4]. Most of the groups are investigating the Suzuki technique [2], which contrasts with the coaxial bridge approach we are currently developing [4].…”

Section: Introductionmentioning

confidence: 99%

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Towards Accurate Measurement of the Frequency Dependence of Capacitance and Resistance Standards up to 10 MHz

Awan¹,

Kibble²

2004

2004 Conference on Precision Electromagnetic Measurements

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“…l(b). The calculated correction for the additional 13 cm cable lengths up to 1 MHz is approximately 100 ppm, whereas the data in Fig. 1(b) shows a difference at 1 MHIz of 300 ppm.…”

Section: Hf Capacitance Measurementsmentioning

confidence: 79%

Section: Closure Of Metrological Imdedance Triangle (Mit)mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Towards Accurate Measurement of the Frequency Dependence of Capacitance and Resistance Standards up to 10 MHz

Awan¹,

Kibble²

2004

2004 Conference on Precision Electromagnetic Measurements

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show abstract

“…The first path tries to extend, by miniaturization and by employing suitable magnetic materials, the frequency range of transformer bridges [4]. The second path, to which this paper belongs, originates from the work of Suzuki [5] and consists in thinking of the standard under calibration as a multiport radiofrequency (rf) coaxial linear network, characterizing it with an rf network analyser, and reconstructing mathematically its Z 4TP . 0957 Suzuki chose to describe such a network by using the impedance matrix Z (see appendix) and showed that the relation between Z 4TP and Z is:…”

Section: Introductionmentioning

confidence: 99%

Fabrication and Optical Characteristics of Electrodeposited Conducting Polymer Thin Film Based on Poly(p-phenylene vinylene) Derivative

Fujisawa

Ootake

Nishihara

et al. 2001

Jpn. J. Appl. Phys.

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The calibration of modern automatic RLC bridges requires a set of impedance standards. Each standard needs in turn a calibration, i.e. the knowledge of its four-terminal-pair impedance Z 4TP at frequencies up to 10-100 MHz-frequencies beyond the capabilities of standard metrological setups for impedance traceability (transformer bridges).It is possible to think of an impedance standard as a multiport linear radiofrequency network; the properties of the network can be mathematically related to its Z 4TP . In the literature, such a connection is made using the relation between the impedance matrix Z i j and Z 4TP , and with careful identification of an ad hoc lumped-parameter electrical model of the standard. A vector network analyser is employed to measure diagonal elements of Z i j directly; non-diagonal elements are measured in an indirect way.Here we derive a new relation between the scattering parameter matrix s i j and Z 4TP of the impedance standard. All s i j elements can be directly measured with a network analyser: we measure scattering parameter spectra of a set of commercial gas-dielectric capacitors. Computed Z 4TP spectra are compatible with those obtained with the Z i j technique, but the new method proves much more sensitive, permitting estimates of the frequency behaviour of an impedance standard even when electrical modelling is inconvenient or impossible.

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“…The evaluation of capacitance standards using the s-parameter method [9][10][11] is very complex and it requires measurement of two-port s-parameters with a vector network analyzer and a lot of computation is required to determine the uncertainty in measurement. The impedance-matrix ([Z]) method proposed by Suzuki [12][13][14] is an alternate technique to characterize the same and it is relatively simple to implement. The present work describes the design approach for an automated module developed for the characterization of 4TP standards of capacitance of values 1000 pF and 100 pF up to 10 MHz using the [Z] method.…”

Section: Introductionmentioning

confidence: 99%

Automated module for characterization of reference standards of capacitance by impedance-matrix method

Singh¹,

John²

2017

Turk J Elec Eng & Comp Sci

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An automated module has been developed, implemented, and validated for the characterization of fourterminal-pair capacitance standards using an impedance-matrix method. These air-dielectric capacitance standards are being used as reference or transfer standards of capacitance at high frequency across national metrology institutes worldwide. In the reported work, an automated characterization module performs the acquisition of reference capacitance and residual capacitive parameters from an ultraprecision capacitance bridge. It also acquires single-port reactances of the capacitance standard from an impedance analyzer at frequencies ranging from 40 MHz to 100 MHz. The acquired capacitive and reactance parameters are stored structurally in arrays from where they are further analyzed according to the impedance-matrix method. The frequency characteristics of four-terminal-pair capacitance standards are thereafter estimated up to 10 MHz and are presented through a user-friendly interface. An automated module provides a reliable, precise, and efficient way to control the frequency characterization of reference standards of capacitance. The reported work emphasizes the importance of automated modules to control complex procedures, which are involved in the advancement of metrology.

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A new universal calibration method for four-terminal-pair admittance standards

Abstract: A new universal calibration method for four-teminal-pair (4TP) admittance standards has been developed for frequencies up to around 1oMHz.

Cited by 8 publications

References 1 publication

Towards Accurate Measurement of the Frequency Dependence of Capacitance and Resistance Standards up to 10 MHz

Towards Accurate Measurement of the Frequency Dependence of Capacitance and Resistance Standards up to 10 MHz

Fabrication and Optical Characteristics of Electrodeposited Conducting Polymer Thin Film Based on Poly(p-phenylene vinylene) Derivative

Automated module for characterization of reference standards of capacitance by impedance-matrix method

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