A new ultra-fast charge pumping measurement technique for N&lt;inf&gt;IT&lt;/inf&gt; characterization without relaxation

Habersat, Daniel B.; Gurfinkel, M.; Horst, Janina; Kim, J.; Xiong, Hao; Cheung, Kin P.; Suehle, John S.; Lelis, Aivars J.; Bernstein, J.B.; Shapira, Yoram

doi:10.1109/isdrs.2007.4422384

2007 International Semiconductor Device Research Symposium 2007

DOI: 10.1109/isdrs.2007.4422384

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A new ultra-fast charge pumping measurement technique for N<inf>IT</inf> characterization without relaxation

Daniel B. Habersat

M. Gurfinkel

Janina Horst

et al.

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A new ultra-fast charge pumping measurement technique for N<inf>IT</inf> characterization without relaxation

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References 5 publications

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