A new technique for quick identification of defective region inside γ-ray detector
Biswajit Das,
R. Palit,
A. Kundu
et al.
Abstract:The γ-ray detection efficiency of a detector decreases over time due to factors like radiation damage or an increase in the thickness of the inactive dead layer. For large γ-ray detector facilities, it is crucial to assess the health condition and performance of the inner regions of the detector crystals over time. In this study, we have introduced a method using GEANT4 simulation to detect defective regions within thick γ-ray detectors. In the experimental phase, a scanning setup was employed, comprising a si… Show more
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