1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)
DOI: 10.1109/ectc.1998.678924
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A new technique for high frequency characterization of capacitors

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Cited by 29 publications
(8 citation statements)
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“…ESR, however, is a very important characteristic and should be considered in practice. As the frequency increases, non-ideal inductor and capacitor values were simply modeled as an ideal inductor and capacitor in series with ESR [37, 38]. Additionally, circuit board performance such as trace characteristics, which might be attributed to the experimental results, was not taken into account for the simulation.…”
Section: Discussionmentioning
confidence: 99%
“…ESR, however, is a very important characteristic and should be considered in practice. As the frequency increases, non-ideal inductor and capacitor values were simply modeled as an ideal inductor and capacitor in series with ESR [37, 38]. Additionally, circuit board performance such as trace characteristics, which might be attributed to the experimental results, was not taken into account for the simulation.…”
Section: Discussionmentioning
confidence: 99%
“…In [7], the accuracy of previous technique was improved by obtaining gain and phase of capacitor voltage using discrete Fourier transform algorithm. Another method for characterization of AEC is suggested in [8].This method requires a network analyzer for measurement, thereby making it costly than other techniques.…”
Section: ) Offline Techniques;mentioning
confidence: 99%
“…TH is used to account for quantization error caused by ADC, that due to noise and error due to sensing elements. Its value is given by range sensing N+1 V TH= +E 2 (8) where, range is the full scale voltage range of ADC , N is the number of bits of ADC and E sensing is the error due to noise and sensing elements.…”
Section: Proposed Schemementioning
confidence: 99%
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“…Although calibration with a short circuit measurement can subtract this fixture inductance, good results cannot be expected when the quantity being subtracted is two orders of magnitude larger than the circa 1 nH inductance of the capacitors we are measuring. High-performance test-fixture design for measuring capacitors with network analyzers are addressed in [7], [8], [9], but these are subject to the limited accuracy at low impedance inherent in the network analyzer approach. To make accurate measurements in a lower impedance range, we used a high performance impedance analyzer (Agilent 4294A) with a new test fixture we developed that has stray inductance on the order of 100 pH, as described in detail in [10].…”
Section: Frequency-domain Measurementsmentioning
confidence: 99%