A new soft error mechanism of dynamic memory with grounded cell plate

Ishiuchi, H.; Okada, Yoichi; Sekiguchi, N.; Tanaka, Tomoharu; Ozawa, O.

doi:10.1109/iedm.1984.190694

1984 International Electron Devices Meeting 1984

DOI: 10.1109/iedm.1984.190694

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A new soft error mechanism of dynamic memory with grounded cell plate

H. Ishiuchi

Yoichi Okada²,

N. Sekiguchi³

et al.

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A new soft error mechanism of dynamic memory with grounded cell plate

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References 8 publications

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