2016
DOI: 10.1021/acs.analchem.6b01153
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A New Radio Frequency Plasma Oxygen Primary Ion Source on Nano Secondary Ion Mass Spectrometry for Improved Lateral Resolution and Detection of Electropositive Elements at Single Cell Level

Abstract: An important application field of secondary ion mass spectrometry at the nanometer scale (NanoSIMS) is the detection of chemical elements and, in particular, metals at the subcellular level in biological samples. The detection of many trace metals requires an oxygen primary ion source to allow the generation of positive secondary ions with high yield in the NanoSIMS. The duoplasmatron oxygen source is commonly used in this ion microprobe but cannot achieve the same quality of images as the cesium primary ion s… Show more

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Cited by 77 publications
(67 citation statements)
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References 21 publications
(35 reference statements)
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“…20 In addition, the instrument can be equipped with both O À and Cs + primary ion beams which are highly focused and energetic, so both positive and negative ions can be imaged. A spatial resolution of $50 nm can be achieved; 21 however, to obtain sufficient signals of the secondary ions from biological samples (e.g. lipids), a lateral resolution of $100 nm is more commonly used.…”
Section: Different Configurations Of Sims and Recent Developmentsmentioning
confidence: 99%
“…20 In addition, the instrument can be equipped with both O À and Cs + primary ion beams which are highly focused and energetic, so both positive and negative ions can be imaged. A spatial resolution of $50 nm can be achieved; 21 however, to obtain sufficient signals of the secondary ions from biological samples (e.g. lipids), a lateral resolution of $100 nm is more commonly used.…”
Section: Different Configurations Of Sims and Recent Developmentsmentioning
confidence: 99%
“…NanoSIMS 50 L (CAMECA, Gennevilliers, France) was used to perform SIMS analysis. This device was equipped with a primary Cs + ion source (lateral resolution down to 50 nm) for the mapping of electronegative elements and with a novel O − RF plasma primary ion source enabling a high sensitivity for electropositive elements combined to a high lateral resolution (40 nm lateral resolution) (Malherbe et al, ). The seven parallel electron multiplier detectors equipped on the NanoSIMS 50 L instrument allowed detection of seven elements at the same time.…”
Section: Methodsmentioning
confidence: 99%
“…The new source has a better current density and long‐term stability, and lateral resolution down to 37 nm (Malherbe et al . ). One application of the new source was the imaging of trace elements in single cells (Penen et al .…”
Section: Advances In Secondary Ion Mass Spectrometrymentioning
confidence: 97%
“…This new ion probe is based on the earlier model Cameca 1280‐HR, but with a new RF plasma oxygen source that allows an enhanced beam density (Malherbe et al . , Liu et al . in press), an automated sample height adjustment and 10 12 Ω resistor Faraday cups.…”
Section: Advances In Secondary Ion Mass Spectrometrymentioning
confidence: 99%