Abstract:In this paper, a new phenomenon regarding to failure bit count (FBC) distribution and data retention time of embedded DRAM with high-K dielectric Ta2O5 MIM capacitors has been observed and explored. Different from conventional knowledge with FBC increase or retention time reduction of DRAM after burn-in, it is found FBC decreased and retention time increased in the sub-0.1um embedded DRAM technology with high-K dielectric Ta2O5 MIM capacitors. Although the band-to-defect tunneling (BDT) induced junction leakag… Show more
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