A new multiharmonic loading method for large-signal microwave and millimeter-wave transistor characterization

Ghannouchi, Fadhel M.; LaRose, Robert; Bosisio, R.G.

doi:10.1109/22.81668

Cited by 57 publications

(8 citation statements)

References 10 publications

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“…measured Using eq. (15) we are able to express VAF as a function of rcE and I,: VAF = rcEIc + V;, = rcEIc + VBc (18) where the intrinsic base collector voltage VLc is assumed to be equal to the extrinsic DC-base collector voltage.…”

Section: Pre-extractionmentioning

confidence: 99%

Parameter extraction for large‐signal modeling of bipolar junction transistors

Rohringer

Kreuzgruber

1995

Int. J. Microw. Mill.‐Wave Comput.‐Aided Eng.

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Section: Pre-extractionmentioning

confidence: 99%

Parameter extraction for large‐signal modeling of bipolar junction transistors

Rohringer

Kreuzgruber

1995

Int. J. Microw. Mill.‐Wave Comput.‐Aided Eng.

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“…It is the responsibility of the power amplifier designers to make sure that they can integrate the power transistor into a well-behaved power amplifier that obeys the strict regulations. There are different techniques of PA design and optimization [1]- [5]. Out of these techniques, waveform based design approach [6]- [11] is the emerging solution as it enables the design based on accurately measured voltage and current waveforms data at the device ports.…”

Section: Introductionmentioning

confidence: 99%

On-line waveform monitoring system for the design and characterization of MIMO RF PAs

El-Deeb

Hashmi

Boulejfen

et al. 2011

2011 24th Canadian Conference on Electrical and Computer Engineering(CCECE)

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A measurement system capable of relative waveform measurement and on-wafer power de-embedding is presented in this paper. A comprehensive description and calibration mechanism of the developed measurement system is reported. The calibration methodology has been implemented on a two-port Microwave Transition Analyzer (MTA) but is readily applicable to multiport receiver system. The calibration strategy is based on reflection measurement using open-short-load (OSL) calibration standards at each port of the measurement system. The proposed calibration algorithm is fast, simple and accurate for power de-embedding and waveform monitoring. This kind of on-wafer power de-embedding and waveform monitoring is helpful in the design of switching mode power amplifiers (PAs). Finally, the relative waveform measurement of a 3W GaAs FET demonstrates that the developed system is capable of accurately monitoring the input and output ports of multiport microwave devices.

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“…This includes various combinations of the following techniques: basic development using optimum biasing and input power conditions (for example, the conduction angle technique) [1][2][3]; fundamental frequency input impedance "matching" [4,5]; input and output filtering [6,7]; and load-pull characterization [8,9].…”

Section: Introductionmentioning

confidence: 99%