A New Model for Timing Jitter Caused by Device Noise in Current-Mode Logic Frequency Dividers

Abstract

Abstract.A new method for predicting timing jitter caused by device noise in current-mode logic (CML) frequency dividers is presented. Device noise transformation into jitter is modeled as a linear time-varying (LTV) process, as opposed to a previously published method, which models jitter generation as a linear time-invariant (LTI) process. Predictions obtained using the LTV method match jitter values obtained through exhaustive simulation with an error of up to 7.7 %, whereas errors of the jitter predicted by the LTI method exceed 57 %.