A new method for noise analysis in nano-scale VLSI circuits using wavelet

Haghayegh, Amir; Forouzandeh, Behjat; Fathi, Davood; Kangarloo, Kaveh

doi:10.1109/dtis.2011.5941440

2011 6th International Conference on Design &Amp; Technology of Integrated Systems in Nanoscale Era (DTIS) 2011

DOI: 10.1109/dtis.2011.5941440

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A new method for noise analysis in nano-scale VLSI circuits using wavelet

Amir Haghayegh

Behjat Forouzandeh

Davood Fathi

et al.

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A new method for noise analysis in nano-scale VLSI circuits using wavelet

Cited by 1 publication

References 18 publications

Impact of crosstalk and process variation on capture power reduction for at-speed test

Impact of crosstalk and process variation on capture power reduction for at-speed test

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