A new mechanism of stabilizing SEI of Si anode driven by crosstalk behavior and its potential for developing high performance Si-based batteries

The significance of mitigating crosstalk in lithium-ion batteries: a review

“…Unexpectedly, Kim et al demonstrated that the crosstalk of Fe ions originating from a LiFePO 4 (LFP) cathode favorably affects the chemical and electrochemical stability of the Si anode in comparison to NCM811 and NCM523 cathodes, which yields improved electrochemical performance in terms of initial Coulombic efficiency and capacity decay. 74 These efforts provide insightful and meaningful investigations into the mechanisms of TMs crosstalk and the detrimental effects on the anode. Nevertheless, there are still many challenging tasks need to be implemented, for example, the reaction routes of TMs and anode remain unclear.…”

Full-Dimensional Analysis of Electrolyte Decomposition on the Cathode–Electrolyte Interface: Deciphering Electrolyte Degradation Mechanisms on the High-Ni LiNixMnyCo1–x–yO2 Cathode–Electrolyte Interface during the Extreme Fast Charging Process

“…Based on the results of the characterization paradigm, it is clear that the structure and composition of CEI are extremely complex, and there are also gradients, as shown in Figure . The products from electrolyte decomposition not only construct the CEI layer but some organics also dissolve in the bulk electrolyte and, moreover, cross over the separator to get reduced on the anode, which participates in the formation of the anode–electrolyte interface layer. , In addition, the different inner layers of CEI layer possess different properties. The outer qSEL is the first guard from electrolyte invasion and a contributor of CEI impedance, which mainly consists of a polymer network with high ionic conductivity .…”

Fluorine Chemistry in Rechargeable Batteries: Challenges, Progress, and Perspectives

“…The ion intensities are proportional to element contents, thus forming a semiquantitative concentration-depth image for probing the chemical composition of the SEI layers. ,− Peled et al were pioneers in applying SIMS for investigating the mechanism of SEI formation on the basal plane and cross-sectional edge of graphite. Since then, depth profiling by SIMS has been utilized widely to probe the SEIs generated on Cu, , graphite, ,,,,− Si, ,,− Li metal, ,,,− etc., demonstrating its ability to analyze the dynamic properties of SEI layers with high sensitivity. Especially, the speculated SEI chemical composition can be confirmed via SIMS by profiling their distribution in depths in the SEI layer.…”