2020
DOI: 10.1016/j.clay.2019.105386
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A new material based on montmorillonite and Cu(II)-phenanthroline complex for effective capture of ammonia from gas phase

Abstract: The intercalation of [Cu(Phen)(H 2 O) 2 ] 2+ (CuPhen) in montmorillonite (Mt) produces a stable hybrid material that is very efficient in removing NH 3 from gas phase even at extremely low pressures.The process was studied by elemental analysis, X-ray powder diffraction, thermal analysis coupled with evolved gas mass spectrometry and DR UV-Vis, NMR and X-ray absorption spectroscopy. The adsorption of CuPhen on Mt consists of two consecutive steps. During the first one, CuPhen intercalates alone into Mt through… Show more

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Cited by 14 publications
(18 citation statements)
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References 30 publications
(38 reference statements)
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“…The XRPD patterns (3 ≤ 2θ( • ) ≤ 40) of Mt-CuPhen before and after exposure are shown in Figure 4. As discussed previously [11,15], the diffraction peaks of Mt-CuPhen with respect to Mt show: (i) a shift towards higher d values of d 001 reflection (d 001 Mt = 1.51 nm; d 001 Mt-CuPhen = 1.71 nm), suggesting that CuPhen species coordinated by sulfate groups, which are about 0.71 nm thick, that occupy the interlayer positions; (ii) higher order XRD reflections, which are approximate multiples of the 2θ angle of the 001 reflection [19], suggesting the presence of more ordered domains.…”
Section: X-ray Diffraction (Xrpd)mentioning
confidence: 82%
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“…The XRPD patterns (3 ≤ 2θ( • ) ≤ 40) of Mt-CuPhen before and after exposure are shown in Figure 4. As discussed previously [11,15], the diffraction peaks of Mt-CuPhen with respect to Mt show: (i) a shift towards higher d values of d 001 reflection (d 001 Mt = 1.51 nm; d 001 Mt-CuPhen = 1.71 nm), suggesting that CuPhen species coordinated by sulfate groups, which are about 0.71 nm thick, that occupy the interlayer positions; (ii) higher order XRD reflections, which are approximate multiples of the 2θ angle of the 001 reflection [19], suggesting the presence of more ordered domains.…”
Section: X-ray Diffraction (Xrpd)mentioning
confidence: 82%
“…The same chemicals and procedures described by the authors in a previous study were used [11]. Specifically, CuSO 4 •5H 2 O was dissolved at room temperature in a well-stirred phenanthroline (Phen) solution in order to obtain a 6 mM solution of Cu(II)Phen; Mt (50 mg) was dispersed in 10 mL of this solution, shaken for 1 h at 250 rpm at room temperature, and then separated from the liquid phase via centrifugation at 14,000× g for 1 min.…”
Section: Preparation Of H 2 S Sorbent Materialsmentioning
confidence: 99%
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