A new examination of secondary electron yield data

Reduction of secondary electron yield for E-cloud mitigation by laser ablation surface engineering

“…The material parameters influencing the SEY are the penetration depth of the primary electron, the stopping power, the escape depth of the secondary electrons, the atomic number Z and, to a lesser extent, the work function [28]. It has been shown that the first crossover energy (where the SEY increases above 1) is strongly dependent on the surface properties whereas the energy at maximum yield is entirely controlled by bulk properties [29].…”

Response to “Comment on ‘Secondary electron yield of multiwalled carbon nanotubes’” [Appl. Phys. Lett. 99, 126103 (2011)]

“…Various mechanisms are involved in SE generation and the energy loss needed for the generation of one SE in each case is very different. The average energy loss for the generation of one SE for carbon has thus been reported to be in the 80-125 eV range 8,9 and Luo et al also agreed to this. 4 As a final note, we point out that one expects a difference between the SE yield of single-walled and multiwalled carbon nanotubes, although such a difference is not expected to be several orders of magnitude.…”

Material characterization and modification using helium lon microscopy : various examples

“…For gold and 35 keV He this yields a maximum SE1 energy of 45 eV. However, this energy is approximately equal to or even below the effective energy needed for secondary electron generation by electrons in many materials [32]. Thus, the size of the electron collision cascade is restricted.…”