1990
DOI: 10.1016/0368-2048(90)85063-f
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A new ESCA instrument with improved surface sensitivity, fast imaging properties and excellent energy resolution

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Cited by 275 publications
(97 citation statements)
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“…[21] The electron take-off angle was 908. The samples were analyzed at a pressure in the range 10-10 mbar.…”
Section: Pes Characterizationmentioning
confidence: 99%
“…[21] The electron take-off angle was 908. The samples were analyzed at a pressure in the range 10-10 mbar.…”
Section: Pes Characterizationmentioning
confidence: 99%
“…However, they indicate that epitaxial relationship between In and W can be expected. To get more information about the behaviour of indium on tungsten we employed imaging property of SCIENTA instrument [17]. Indium films of 2.0-2.8 ML thickness have been deposited on the area a little smaller than one half of the tungsten surface.…”
Section: Surface Diffusion Of In Atoms On the Polycrystalline Tungstementioning
confidence: 99%
“…In the ESCA measurements Al Ka X-ray photons (1486.7 eV) generated from a rotating anode are used for the excitation of secondary electrons and of photoelectrons from Cs 3d and I 3d core levels. The ESCA-300 system is described in [32]. Briefly, we worked with an energy resolution of 0.30 eV and a lateral resolution of 27 pm, as determined by resolving lithographic microstructures.…”
Section: Csi Film Characterizationmentioning
confidence: 99%
“…Furthermore the lateral resolution is crucial in the study of insulators where local charging effects can easily induce artifacts in spatially integrated X-ray photoemission results [31]. Our study employed a laterally resolved Electron Spectroscopy for Chemical Analysis (ESCA-300) apparatus [32] and a Scanning Auger Microprobe (SAM) to investigate the lateral inhomogeneity of the surface stoichiometry of polycrystalline CsI films. To obtain the local quantum efficiency (QE) we measured the secondary electron photoemission by a Photoemission Electron Microscope both in PEEM mode (excitation by a nonmonochromatized deuterium lamp) and in XSEM mode (excitation by tunable X-ray synchrotron radiation source) [33].…”
Section: Introductionmentioning
confidence: 99%