A new coplanar waveguide vector network analyzer for on-wafer measurements

Bellantoni, J.V.; Compton, R.C.

doi:10.1109/cornel.1989.79836

Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits

DOI: 10.1109/cornel.1989.79836

|View full text |Cite

A new coplanar waveguide vector network analyzer for on-wafer measurements

J.V. Bellantoni

R.C. Compton

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Publication Types

Select...

Other1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 5 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

A new coplanar waveguide vector network analyzer for on-wafer measurements

Cited by 1 publication

References 5 publications

A vector network analyzer integrated into coplanar-waveguide probes

A vector network analyzer integrated into coplanar-waveguide probes

Contact Info

Product

Resources

About