1981
DOI: 10.1107/s0021889881008996
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A new computer program for Rietveld analysis of X-ray powder diffraction patterns

Abstract: The Rietveld [J. Appl. Cryst. (1969), 2, 65-71] method of structure refinement from powder diffraction patterns is widely used with neutron data and increasingly so with X-ray data. A computer program for the application of the method with X-ray data, or with neutron nuclear scattering data, has been written ab initio in an effort to make it versatile, user oriented, portable, convenient, and largely self-contained yet reasonably comprehensive. It is of modular construction to facilitate user-desired modificat… Show more

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Cited by 1,472 publications
(580 citation statements)
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“…As it can be clearly seen from the inset of Fig.1, the grain size increases with increasing T s and the diffraction peak (0 2 4) shifts towards the lower angle from sample A to D, which is consistent with many results reported elsewhere [11,16]. The structural parameters of the samples are refined by the standard Rietveld technique [21] and the fitting between the experimental spectra and the calculated values is quite well based on the consideration of lower R P values as shown in Table 1. It shows that the lattice parameters of The magnetization as a function of the applied magnetic field at 5 K is shown in Fig.3.…”
supporting
confidence: 88%
“…As it can be clearly seen from the inset of Fig.1, the grain size increases with increasing T s and the diffraction peak (0 2 4) shifts towards the lower angle from sample A to D, which is consistent with many results reported elsewhere [11,16]. The structural parameters of the samples are refined by the standard Rietveld technique [21] and the fitting between the experimental spectra and the calculated values is quite well based on the consideration of lower R P values as shown in Table 1. It shows that the lattice parameters of The magnetization as a function of the applied magnetic field at 5 K is shown in Fig.3.…”
supporting
confidence: 88%
“…The internal friction g" 1 is calculated as Q~i =: k/(nf r ) with * the exponential decay parameter of the bending mode component [7]. Crystal structure analysis as performed using in situ high temperature X-ray diffractometry (Seifert 3003 TT, HDK 2.4 furnace, Cu-K<,) and Rietveld refinement (DBWS 9006PC program -new version [8]). Volume fractions of the observed phases were derived from the results of the Rietveld refinement according to [9].…”
Section: Methodsmentioning
confidence: 99%
“…The recorded powder XRD patterns were used to estimate the lattice parameters using the Fullproff program [10]. The surface morphology of the samples was studied using scanning electron microscopy (JEOL JSM 840A) by sputtering technique with gold as the covering contrast material.…”
Section: Instruments Usedmentioning
confidence: 99%