A new built-in screening methodology to achieve zero defects in the automotive environment

Malandruccolo, Vezio; Ciappa, Mauro; Rothleitner, H.; Fichtner, W.

doi:10.1016/j.microrel.2009.07.016

Cited by 10 publications

(5 citation statements)

References 6 publications

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“…The main issue of the traditional DLT is related to the fact that this procedure can only be carried out if the direct access to the drain contact is directly (and separately) ensured [11]. Actually, the direct contact to the drain contact of LDMOS is just granted through the pins if they are used to drive external loads.…”

Section: ) Traditional Screening Procedures For Stimentioning

confidence: 99%

See 1 more Smart Citation

In situ screening techniques for defective oxides in devices for automotive applications

Malandruccolo¹,

Ciappa²,

Fichtner³

et al. 2011

2011 International Reliability Physics Symposium

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Efficient screening procedures for the control of the defectivity are vital to limit early failures especially in critical automotive applications. Traditional strategies based on burn-in and in-line tests are able to provide the required level of reliability but they are expensive and time consuming. This paper presents novel built-in circuitries to screen out oxide defects in integrated circuits for the most important building blocks used in automotive applications. The proposed techniques are based on an embedded circuitry that includes control logic, high voltage generation, and leakage current monitoring. The concept and advantages of the proposed screening procedure are described in very detail and demonstrated experimentally in conjunction with the integration of test-chips.

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Section: ) Traditional Screening Procedures For Stimentioning

confidence: 99%

“…A detailed description of the circuit implementing the concept together with circuit simulation results can be found in [11].…”

Section: ) Working Principlementioning

confidence: 99%

In situ screening techniques for defective oxides in devices for automotive applications

Malandruccolo¹,

Ciappa²,

Fichtner³

et al. 2011

2011 International Reliability Physics Symposium

View full text Add to dashboard Cite

show abstract

“…Later, the modifications that are needed to add the built-in DLT (BI-DLT) functionality in the existing circuits have been presented [8]. Finally, a new procedure has been prototyped and validated experimentally after integrating both functionality in a test chip [9].…”

Section: New Built-in Defect-based Techniquementioning

confidence: 99%

“…Advantages of the BI-DLT: The BI-DLT provides major advantages either as a stand-alone screening technique or in conjunction with a traditional burn-in procedure [8]. The design solution proposed here for the stand-alone version refers to an LS switch with direct access to the drain and source through external pins.…”

Section: A Working Principlementioning

confidence: 99%

Design and Experimental Characterization of a New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

Malandruccolo

Ciappa

Rothleitner

et al. 2011

IEEE Trans. Device Mater. Relib.

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Efficient screening procedures for the control of defectivity are vital to limit early failures, particularly in critical automotive applications. Traditional strategies based on burn-in and in-line tests are able to provide the required level of reliability, but they are expensive and time consuming. This paper presents a novel built-in circuitry to screen out gate oxide and crystalrelated defects in Lateral Diffused MOS transistors. The proposed technique is based on an embedded circuitry that includes control logic, high-voltage generation, and leakage current monitoring. The concept and the advantages of the proposed screening procedure are described in detail and demonstrated experimentally in conjunction with the integration of a test chip.Index Terms-Built-in self-test, burn-in, crystal defects, gate oxide reliability, gate stress test (GST).

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“…Screening Methodologies. Nowadays, the most common procedure to screen gate oxide defects at chip level is still the so-called gate stress test (GST), where a high voltage pulse is applied through an Automatic Test Equipment (ATE) to dedicated test pads of the LDMOS gate [5]. Subsequently, the eventual occurrence of the oxide breakdown is detected by the measurement of the leakage current through the gate oxide.…”

Section: Introductionmentioning

confidence: 99%

A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

et al. 2010

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Efficient screening procedures for the control of the defectivity are vital to limit early failures especially in critical automotive applications. Traditional strategies based on burn-in and in-line tests are able to provide the required level of reliability but they are expensive and time consuming. This paper presents a novel built-in reliability testing methodology to screen out gate oxide and crystal related defects in Lateral Diffused MOS transistors. The proposed technique is based on an embedded circuitry that includes control logic, high voltage generation, and leakage current monitoring. The concept, advantages and the circuit for the proposed test procedure are described in very detail and illustrated by circuit simulation.

show abstract

A new built-in screening methodology to achieve zero defects in the automotive environment

Cited by 10 publications

References 6 publications

In situ screening techniques for defective oxides in devices for automotive applications

In situ screening techniques for defective oxides in devices for automotive applications

Design and Experimental Characterization of a New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

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