A new approach to the electric aging of dielectrics

Crine, J.‐P.; Parpal, J.-L.; Dang, C.

doi:10.1109/ceidp.1989.69540

Cited by 20 publications

(14 citation statements)

References 4 publications

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“…In general, any number, , of probability distributions can be mixed where the total probability function is (5) where normalization requires .…”

Section: Mixed Weibull Funtionsmentioning

confidence: 99%

“…Although such distributions provide reasonable empirical fits, there is debate as to how or even if fitting parameters of the Weibull distributions correspond to physical properties of a test material [3]. While simple approximations have led to basic physical models of electrostatic discharge (ESD) [4][5][6], empirical models are necessitated by the difficulty in reliable physical descriptions of breakdown processes in HDIM. This paper describes how insights from simple physical models can be extended to explain some characteristics of the empirical fits.…”

Section: Introductionmentioning

confidence: 99%

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Mixed Weibull distribution model of DC dielectric breakdowns with dual defect modes

Andersen

Dennison

2015

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

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This work provides physical insight into common statistical models for DC dielectric breakdown field strengths. Voltage step-up tests were performed on low density polyethylene films. The merits of generalizations to widely-used empirical Weibull models are discussed. The cumulative probability distributions of the breakdown fields were fit to standard two-and three-parameter Weibull distributions. Mixed two-parameter Weibull distributions, sometimes used in the literature to model multiple breakdown modes, were found to yield the best fits to the data. In addition, the same data were fit to a physically-motivated dual-defect mean field model incorporating both low-and highenergy defect modes with different defect densities; this produced a much better fit than single-defect mean field models. Values obtained for the mean defect energies and densities were within the ranges expected from independent determinations of these intrinsic materials properties. By incorporating these physicsbased concepts into traditionally empirical models, their accuracy and utility can be extended. The mixed Weibull distribution and the dual-defect model predicted very similar cumulative distributions of LDPE breakdown data, suggesting that mixed Weibull distributions may reflect similar multiple defect modes used in dual-defect models. Theories of DC breakdown, based on distributions of microscopic defects in disordered insulating materials may provide improved guidance in understanding the physical origins of empirical parameters used in statistical methods to characterize breakdown properties.

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“…In general, any number, , of probability distributions can be mixed where the total probability function is (5) where normalization requires .…”

Section: Mixed Weibull Funtionsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Mixed Weibull distribution model of DC dielectric breakdowns with dual defect modes

Andersen

Dennison

2015

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

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“…• Electrical aging models [26][27][28], • Thermal aging models [29][30][31][32][33], • Mechanical aging models [34].…”

Section: Use Of Physical and Mathematical Modelsmentioning

confidence: 99%

“…The intensity of an electric field is another major degradation factor that significantly affects insulation systems [26][27][28]. The mechanism of action of the electric field on the insulation structure is yet to be fully understood.…”

Section: Electrical Aging Modelsmentioning

confidence: 99%

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Proposal of Physical-Statistical Model of Thermal Aging Respecting Threshold Value

Soucek¹,

Trnka

Hornak

2017

Energies

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Abstract:The aging of electrical insulation material or a system is a main issue for designers of high-voltage (HV) machines. Precise determination of the life cycle of electrical insulation is one way of improving the efficiency of electrical machines involved in the production and transmission of electrical energy. Much effort has been devoted to preparing statistical or physical methods of Electrical Insulating System (EIS) life time estimation in the real operation of electrical machinery. The main aim of this paper is to introduce a new physical-statistical model of thermal aging respecting the threshold value. This model is based on thermal aging model and the main difference between this model and previously published models is taking into account the threshold value of degradation factor. The complete design of this model is presented in this paper, including functions defining the threshold value of the effect of the degradation factor depending on the temperature. Proposed model was verified by accelerated thermal aging test at selected temperatures (160, 170, 180 • C) and time intervals (0, 120, 240 h) on a commonly used transformer board. The breakdown voltage was set as an indicating parameter of the level of thermal aging and was measured according to standard IEC 60243-1. Collected data from these measurements were used for threshold value determination (431.23 K) and verification of proposed physical-statistical model of thermal aging respecting the threshold value.

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Pressure effect on the electrical ageing of polyethylene

Lalam

Hoang‐Thê‐Giam

2000

J. Phys. D: Appl. Phys.

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The purpose of this study is to show the effect of hydrostatic pressure on the electrical ageing, by a dc voltage, on polyethylene used in submarine cables. Experimental results are obtained at 1 and 300 bar, for a temperature of 70 °C in the range of an electrical field of 1.1-4.5 MV cm-1 and for up to 1500 h of ageing. By using the Weibull statistic and the estimation of confidence bounds of 90%, the results have shown an increase of lifetime with pressure. The time dependence of the breakdown behaviour of the two materials (HDPE and XLPE) is consistent with the inverse power law model. The pressure effect may be explained by changes in the activation free energy for the formation of submicrocavities.

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A new approach to the electric aging of dielectrics

Cited by 20 publications

References 4 publications

Mixed Weibull distribution model of DC dielectric breakdowns with dual defect modes

Mixed Weibull distribution model of DC dielectric breakdowns with dual defect modes

Proposal of Physical-Statistical Model of Thermal Aging Respecting Threshold Value

Pressure effect on the electrical ageing of polyethylene

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