A new approach to estimate complex permittivity of dielectric materials at microwave frequencies using waveguide measurements

Deshpande, M.D.; Reddy, C. J.; Tiemsin, Pacita I.; Cravey, Robin L.

doi:10.1109/22.563334

Cited by 66 publications

(46 citation statements)

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“…This is well known for isotropic materials [2,3,12,20], bi-isotropic (chiral) materials [9,17], and even anisotropic materials where an optical axis is along the waveguide axis [1,10,15,16], but for general bianisotropic media with arbitrary axes there are so far very few results available. In principle, an optimization approach as in [12] and [16] can be designed, where the material parameters are found by minimizing the distance between measured and simulated S-parameters. However, this method is typically plagued by non-uniqueness and similar numerical issues, and we seek a more direct method, providing physical insight to the problem.…”

Section: Introductionmentioning

confidence: 99%

Determination of Propagation Constants and Material Data From Waveguide Measurements

Sjöberg¹

2009

PIER B

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Abstract-This paper presents an analysis with the aim of characterizing the electromagnetic properties of an arbitrary linear, bianisotropic material inside a metallic waveguide. The result is that if the number of propagating modes is the same inside and outside the material under test, it is possible to determine the propagation constants of the modes inside the material by using scattering data from two samples with different lengths. Some information can also be obtained on the cross-sectional shape of the modes, but it remains an open question if this information can be used to characterize the material. The method is illustrated by numerical examples, determining the complex permittivity for lossy isotropic and anisotropic materials.

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Section: Introductionmentioning

confidence: 99%

Determination of Propagation Constants and Material Data From Waveguide Measurements

Sjöberg¹

2009

PIER B

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“…Since the measurement of ε r and μ r requires consideration of different TE and TM modes, this process greatly increases the computation time [32]. In this research paper, to decrease this time we propose a waveguide geometry for ε r and μ r measurement of a sample sandwiched between stable and movable plugs, as shown in Fig.…”

Section: Derivation Of Complex S-parametersmentioning

confidence: 99%

Thickness-Independent Automated Constitutive Parameters Extraction of Thin Solid and Liquid Materials From Waveguide Measurements

Hasar¹

2009

PIER

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Abstract-The constitutive parameters measurement of thin solid and liquid materials by transmission-reflection methods generally suffers from a) the requirement of the transformation of measured scattering parameters from the reference plane to the end surfaces of the material (measurement plane) and b) inaccurate knowledge on the length of the material, if the material does not fill the entire measurement cell (a waveguide or coaxial-line section). In this research paper, a microwave waveguide method for constitutive parameters determination of these materials is proposed to simultaneously eliminate these problems. There are three main advantages of the proposed method as: a) it explicitly determines the constitutive parameters from measured S-parameters; b) it does not require the knowledge about sample length since it directly measures it as a byproduct of the method; and c) it offers a self-checking feature to trace the performance and accurateness of measurements. This feature does not depend on the constitutive parameters of the sample. We measured the complex permittivity of some thin solid and liquid test samples for validation of the method.

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“…The most common and widespread one-and two-port techniques are transmission-line techniques (open-ended coaxial probe (Misra et al (1990); Xu et al (1991)), rectangular (Deshpande et al (1997);Faircloth et al (2006);Jarem et al (1995)) or cylindrical (Ligthart (1983)) waveguide, microstrip or stripline (Barry (1986); Queffelec et al (1994))), free-space measurement (Galek et al (2010); Ghodgaonkar et al (1990)) and cavity resonator (Yoshikawa and Nakayama (2008)). These techniques are different for accuracy and frequency bandwidth of measurement; some are nondestructive and noncontacting and may require sample preparation.…”

Section: Techniques Of Measurementmentioning

confidence: 99%

“…Such applications span printed circuit board design, electromagnetic shielding, biomedical research and determination of EM radiation hazards (Deshpande et al (1997); Li et al (2011);Murata et al (2005)). The electric and magnetic properties of materials usually depend on several factors: frequency, temperature, linearity, isotropy, homogeneity, and so on.…”

Section: Introductionmentioning

confidence: 99%

Electric and Magnetic Characterization of Materials

Sandrolini¹,

Reggiani²,

Artioli³

2011

Behaviour of Electromagnetic Waves in Different Media and Structures

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A new approach to estimate complex permittivity of dielectric materials at microwave frequencies using waveguide measurements

Cited by 66 publications

References 1 publication

Determination of Propagation Constants and Material Data From Waveguide Measurements

Determination of Propagation Constants and Material Data From Waveguide Measurements

Thickness-Independent Automated Constitutive Parameters Extraction of Thin Solid and Liquid Materials From Waveguide Measurements

Electric and Magnetic Characterization of Materials

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