A multiple pin, flip-chip system for microwave and gigabit per second cryogenic device testing at variable temperatures

Abstract

We have developed a cryogenic probe and cryostat system to test both active and passive superconducting devices and circuits up to microwave frequencies at variable temperatures. Our system consists of two basic parts: the cryostat and the matching probe. The cryostat is a unique, very efficient, variable temperature, flow-type cryostat, where we control temperature without electrical heaters. It is magnetically shielded and allows rapid testing between 4.2 K and room temperature. Probes developed for this cryostat have a larger number of shorter cables than standard dip-type probes. They are designed to test chips or chip assemblies without additional packaging. Chips or chip assemblies can be quickly mounted and dismounted from a fixed spring-contact assembly. Each probe has 56 wide-bandwidth signal cables. We have repeatedly used these probes for testing both active and passive superconducting integrated circuits up to 20 GHz. The probe and cryostat combination provides a testing capability that is simultaneously high frequency, dc magnetic shielded, has variable cryogenic temperature, and quick turnaround.

High speed data link between digital superconductor chips

“…For convenience, a single chip was used; signals were sent off the chip onto the carrier, and then back onto the same chip. The circuit was tested by a high speed probe 16 in a variable temperature He flow cryostat at 4.2 K. Our chip includes auxiliary circuits that comprise a high speed, three-channel BER tester. A two-junction voltagecontrolled oscillator generates the system's clock.…”

Architecture and Design of an 8-Bit Flux-1 Superconductor RSFQ Microprocessor

“…To be successful, however, any future design of an RSFQ microprocessor will require much more detailed functional and circuit-level verification. 15 Multi-channel Octopux system 16 connected the probe is used to apply test vectors, read-out and analyze test results, as well as control bias current sources. In order to significantly decrease the bit error rate currently observed in the first FLUX-1 chips, we consider the design and fabrication of next versions of the FLUX-1 chips with current recycling and other circuit-level improvements incorporated.…”

A GHz multi-channel cryogenic test fixture for superconducting integrated circuit testing

“…TRW has also reported on a multi pin, flip-chip type cryogenic device testing system [2]. Its high frequency characteristic was limited due to the large inductance of a pin probe.…”