A Multi-Year Survey of Stem-End Chip Defect in Chipping Potatoes (Solanum Tuberosum L.)

Wang, Yi; Bethke, Paul C.; Drilias, Michael J.; Schmitt, William G.; Bussan, Alvin J.

doi:10.1007/s12230-014-9414-8

Cited by 3 publications

(3 citation statements)

References 21 publications

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“…Thus, maintaining chip quality in locations that experience transient high temperatures will be challenging. The data presented in Figs and and previous studies, suggest that chipping potato varieties differ in their susceptibility to reducing sugar accumulation and SECD formation in response to transient high temperature conditions. Breeding chipping potatoes for reduced sensitivity to heat stress and planting resistant varieties in areas prone to heat stress will be required for consistent production of a high‐quality crop.…”

Section: Discussionsupporting

confidence: 74%

“…Glucose concentration at the tuber basal end was, in some cases, weakly correlated with SECD development . The glucose content at the tuber apical end has been consistently reported to be less than 0.1 mg g −1 fresh weight, and a correlation between apical‐end glucose content and SECD severity has not been observed …”

Section: Introductionmentioning

confidence: 96%

“…proposed that day temperatures higher than 30 °C or night temperatures greater than 18 °C might be necessary for consistent SECD development. Data from a multi‐year field survey suggested that greater SECD severity was associated with elevated night temperatures during bulking in July and August . SECD development was greater in North American field trials conducted in 2012, when summer temperatures were above historical averages, than in 2013, which had an atypically cool growing season…”

Section: Introductionmentioning

confidence: 99%

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Transient heat stress during tuber development alters post‐harvest carbohydrate composition and decreases processing quality of chipping potatoes

2018

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BACKGROUND: Adverse air and soil temperatures are abiotic stresses that occur frequently and vary widely in duration and magnitude. Heat stress limits productivity of cool-weather crops such as potato (Solanum tuberosum) and may degrade crop quality. Stem-end chip defect is a localized discoloration of potato chips that adversely affects finished chip quality. The causes of stem-end chip defects are poorly understood. RESULTS: Chipping potatoes were grown under controlled environmental conditions to test the hypothesis that stem-end chipdefect is caused by transient heat stress during the growing season. Heat stress periods with 35 ∘ C days and 29 ∘ C nights were imposed approximately 3 months after planting and lasted for 3, 7 or 14 days. At harvest and after 1, 2 and 3 months of storage at 13 ∘ C, potato tubers were evaluated for glucose, fructose, sucrose and dry matter contents at the basal and apical ends. Chips were fried and rated for defects at the same sampling times. Differences in responses to heat stress were observed among four varieties of chipping potatoes. Heat stress periods of 7 and 14 days increased reducing sugar content in the tuber basal and apical ends, decreased dry matter content, and increased the severity of stem-end chip defects. CONCLUSION: Transient heat stress during the growing season decreased post-harvest chipping potato quality. Tuber reducing sugars and stem-end chip defects increased while dry matter content decreased. Planting varieties with tolerance to transient heat stress may be an effective way to mitigate these detrimental effects on chipping potato quality.

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Section: Discussionsupporting

confidence: 74%

Section: Introductionmentioning

confidence: 96%

Section: Introductionmentioning

confidence: 99%

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Transient heat stress during tuber development alters post‐harvest carbohydrate composition and decreases processing quality of chipping potatoes

2018

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Identification of Quantitative Trait Loci for Stem-End Chip Defect and Potato Chip Color Traits in a ‘Lenape’-Derived Full-Sib Population

Frederick

Bethke

2019

Am. J. Potato Res.

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Current-Season Infection With Ordinary and Recombinant Strains of Potato virus Y Has Detrimental Effects on Chipping Potato Yield and Tuber Quality

2021

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Potato virus Y (PVY) is the most economically important virus infecting potatoes worldwide. Current-season spread of PVY occurs when aphids transmit the virus from infected to non-infected plants during the growing season. The impact of current-season PVY infection on yield and quality of chip processing potatoes is not well documented. In a replicated, greenhouse experiment conducted over two years, we measured the effect of current-season infection with four PVY strains, PVYO, PVYN-Wi, PVYNTN and PVYN:O, on chip processing varieties ‘Atlantic’, ‘Lamoka’ and ‘Snowden’. PVY infection decreased yield and tuber specific gravity for some combinations of potato variety and virus strain but did not affect the appearance of chips including the prevalence of stem-end chip defects. This work suggests that current-season infection of chipping potatoes imposes a cost on producers and emphasizes the need for continued investment in seed certification and development of PVY-resistant cultivars.

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A Multi-Year Survey of Stem-End Chip Defect in Chipping Potatoes (Solanum Tuberosum L.)

Cited by 3 publications

References 21 publications

Transient heat stress during tuber development alters post‐harvest carbohydrate composition and decreases processing quality of chipping potatoes

Transient heat stress during tuber development alters post‐harvest carbohydrate composition and decreases processing quality of chipping potatoes

Identification of Quantitative Trait Loci for Stem-End Chip Defect and Potato Chip Color Traits in a ‘Lenape’-Derived Full-Sib Population

Current-Season Infection With Ordinary and Recombinant Strains of Potato virus Y Has Detrimental Effects on Chipping Potato Yield and Tuber Quality

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