Voltage references are fundamental to mixed signal converters which are widely used in electronics. Hence there are significant advantages in having the voltage reference operate with less power while minimizing area consumption and maintaining performance. Past designs have suffered from issues related to process variations which adversely affect the temperature coefficient of the circuit output. To compensate for these process variations, a means to modify the temperature coefficient are proposed and experimentally verified with two circuit architectures.Five test chip samples implement these architectures in a 0.35 µm CMOS process. Design methodologies for both architectures are presented. Design techniques include the use of a high-swing cascode to improve Line Sensitivity while minimizing additional power consumption, accounting for a well-matched layout, and the effect of leakage currents on the performance of the circuit.Layout schematics, performance figures, test methodologies and results are presented. Each circuit dissipates less than 4 nW and operates down to 0.9 V or better with Line Sensitivity and Power Supply Rejection Ratio of less than 0.15 %/V and -58 dB respectively, while consuming an area of 0.053 mm 2 or less. The experimental average and median temperature coefficient was less than 26 ppm/ • C and 22 ppm/ • C respectively in the −20 • C to 80 • C range, with the best performance being less than 8.1 ppm/ • C. Areas of improvement and potential areas of future research are then identified to facilitate advancement of this work. This work contains many thanks:• Thanks Dr. Carlos Christoffersen for continuing to push the boundaries of what can be done and encouraging the free expression of new ideas.