A Model to Predict the Effects of Postharvest Environment on Quality Deterioration of Common Bean (Phaseolus vulgaris L.)

祐介, 花田; Yusuke, Hanada; Yasunaga, Eriko; 円理子, 安永; Uchino, Toshitaka; 敏剛, 内野; 史彦, 田中; Tanaka, Fumihiko; 浩平, 中野; Nakano, K.; Chikushi, Jiro; 二郎, 筑紫

doi:10.2525/shita.23.66

J. Sci. High Tech. Agric.

2011

DOI: 10.2525/shita.23.66

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A Model to Predict the Effects of Postharvest Environment on Quality Deterioration of Common Bean (Phaseolus vulgaris L.)

花田祐介¹,

Hanada Yusuke²,

Eriko Yasunaga

et al.

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A Model to Predict the Effects of Postharvest Environment on Quality Deterioration of Common Bean (Phaseolus vulgaris L.)

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