A model of heat transfer in STM-based magnetic recording on CoNi/Pt multilayers

Zhang, Li; Bain, J.A.; Zhu, Jian‐Gang; Abelmann, Léon; Onoue, T.

doi:10.1016/j.physb.2006.01.007

Cited by 6 publications

(7 citation statements)

References 19 publications

(24 reference statements)

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“…It is known that both metals [61,62] and semiconductors [63][64][65] in thin-film configuration can have significantly lower heat conduction compared with bulk materials. Furthermore, as was shown for superlattices [55,66] and for metallic MLs [67] with layer thickness on the same scale as the Sc/Si MLs investigated here, the heat conduction can be reduced by an order of magnitude compared with the bulk value. Comparing the evaluation of heat removal time in the HAZ with the characteristic diffusion time, we can conclude that the mean heat conduction of the studied samples takes about one-tenth of the bulk, and its average value is ∼2 W m −1 K −1 or even less.…”

Section: Discussionsupporting

confidence: 76%

Mechanisms of radiation damage to Sc/Si multilayer mirrors under EUV laser irradiation

Pershyn¹,

Zubarev²,

Voronov³

et al. 2009

J. Phys. D: Appl. Phys.

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Specific structural changes in Sc/Si multilayer mirrors irradiated with extreme ultraviolet (EUV) laser single pulses (λ = 46.9 nm) at near damage threshold fluences (0.04-0.23 J cm −2 ) are analysed. We have identified melting of surface layers as the basic degradation mechanism for the mirrors. Both heat generation during silicide formation and low heat conduction of the layered system significantly decreases the degradation threshold of Sc/Si multilayer mirrors compared with bulk materials. The results are relevant to the use of the multilayer mirrors for shaping and directing the intense beams produced by the new generation of coherent EUV sources.

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Section: Discussionsupporting

confidence: 76%

Mechanisms of radiation damage to Sc/Si multilayer mirrors under EUV laser irradiation

Pershyn¹,

Zubarev²,

Voronov³

et al. 2009

J. Phys. D: Appl. Phys.

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“…The minimum domain size, observed by optical microscopy, was 250 nm 95,96 , but smaller domains might have been present. The experiment was repeated by Zhang et al but now the bits were imaged by MFM [97][98][99][100][101][102][103] . Bits sizes down to 170 nm were observed in Co/Pt multi-layers and weakly coupled CoNi/Pt granular media by Zhong 104 .…”

Section: Data Writingmentioning

confidence: 99%

Probe-based data storage

Koelmans,

Engelen,

Abelmann

2015

Preprint

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Probe-based data storage attracted many researchers from academia and industry, resulting in unprecedented high data-density demonstrations. This topical review gives a comprehensive overview of the main contributions that led to the major accomplishments in probe-based data storage. The most investigated technologies are reviewed: topographic, phase-change, magnetic, ferroelectric and atomic and molecular storage. Also, the positioning of probes and recording media, the cantilever arrays and parallel readout of the arrays of cantilevers are discussed. This overview serves two purposes. First, it provides an overview for new researchers entering the field of probe storage, as probe storage seems to be the only way to achieve data storage at atomic densities. Secondly, there is an enormous wealth of invaluable findings that can also be applied to many other fields of nanoscale research such as probe-based nanolithography, 3D nanopatterning, solid-state memory technologies and ultrafast probe microscopy. B. Current status of probe storageThe maturity of the various types of probe storage differs significantly. Four popular types, namely phase change, magnetic, thermomechanical and ferroelectric storage are listed in table I.Probe-based data storage has attracted much scientific and commercial interest [18][19][20] . After more than two decades of research on probe storage, an overview of what has been accomplished so far, together with an outlook of the a)

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“…(6), with a bias voltage of 6 V, the calculated current is about 2:2 Â 10 À4 A for 1000 nm tip radius and only 0:2$1:0 Â 10 À7 A for 1-10 nm tip radius. A detailed model of nano-scale heat transfer in a multilayered thin film structure is published elsewhere [12]. In that model, the extrapolated mark size is given by the thermal profile during the pulsed heating when the temperature of the heated region reaches the peak value.…”

Section: Article In Pressmentioning

confidence: 99%

“…This has the possibility of very high spatial resolution as scanning tunneling microscopy (STM), which shows atomic resolution in surface observation [6][7][8]. Some previous work has been done on the demonstration of the STM-based HAMR process on a perpendicular medium [9][10][11][12], but the theoretical model of the write current has not been published yet. In this work, I demonstrated the recording process using different STM tips and completed the model of the writing current based on the Fowler-Nordheim theory [13].…”

Section: Introductionmentioning

confidence: 99%

A model of heat transfer in STM-based magnetic recording on CoNi/Pt multilayers

Cited by 6 publications

References 19 publications

Mechanisms of radiation damage to Sc/Si multilayer mirrors under EUV laser irradiation

Mechanisms of radiation damage to Sc/Si multilayer mirrors under EUV laser irradiation

Probe-based data storage

Application of field emission in prolate-spheroidal coordinate in heat-assisted magnetic probe recording

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