1995
DOI: 10.1080/10402009508983469
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A Model for the Boundary Film Formation and Tribological Behavior of a Phosphazene Lubricant on Steel

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Cited by 28 publications
(15 citation statements)
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“…Similar findings with engine oil on metal surfaces have been reported to contain films composed of low concentrations of Zn, P, S with Ca and O as the topmost layer of the tribofilm [15]. These species have been reported to affect the antiwear properties of tribofilms [22,23]. Uy et al [24] also investigated the tribofilms formed on tappets with Raman and observed Ca/Zn orthophosphate (Zn 3 (PO4) 2 ), CaCO 3 , Fe 3 O 4 with some undecomposed hydrocarbon on the surface.…”
Section: Introductionsupporting
confidence: 71%
See 1 more Smart Citation
“…Similar findings with engine oil on metal surfaces have been reported to contain films composed of low concentrations of Zn, P, S with Ca and O as the topmost layer of the tribofilm [15]. These species have been reported to affect the antiwear properties of tribofilms [22,23]. Uy et al [24] also investigated the tribofilms formed on tappets with Raman and observed Ca/Zn orthophosphate (Zn 3 (PO4) 2 ), CaCO 3 , Fe 3 O 4 with some undecomposed hydrocarbon on the surface.…”
Section: Introductionsupporting
confidence: 71%
“…The low levels of Zn, P, and S of the tribofilm on the wear track at points 1,2, 3, and 4 clearly reduces the antiwear properties on the inserts [23]. This could be as a result of the dispersant used in the oil.…”
Section: Scanning Electron Microscopy/energy Dispersive X-rays (Sem/edx)mentioning
confidence: 99%
“…It has been stated that the tribological properties of iron fluorides are better than those of naked metal surfaces [30,31]. Despite the fact that the iron fluorides possess physical properties that are conducive to better tribological properties, they have certain disadvantages from a chemical perspective.…”
Section: Lubrication Mechanismmentioning
confidence: 99%
“…Techniques such as X-ray Photoelectron Spectroscopy (XPS) [2][3][4][5][6][7][8][9], Auger Electron Spectroscopy (AES) [3,[6][7][8][9][10][11] and Secondary Ion Mass Spectrometry (SIMS) [12,13] in conjunction with ion etching, have been used to determine the physical film thickness. Surface profilometry [9] may be used to measure the depth of the etched crater.…”
Section: Introductionmentioning
confidence: 99%