A Microwave Diffraction Tomography System for Biomedical Applications

Peronnet, G.; Pichot, Ch.; Bolomey, Jean-Charles; Jofre, L.; Izadnegahdar, A.; Szeles, Csaba; Michel, Yves; Guerquin‐Kern, Jean‐Luc; Gautherie, M

doi:10.1109/euma.1983.333285

Cited by 16 publications

(1 citation statement)

References 12 publications

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“…This, however, is not a valid assumption for electromagnetic scattering imaging systems. Later, for faster scanning speed, electronic raster scanning of the electric fields was reported in [11,21,[25][26][27]. Generally speaking, electronic raster-scanning-based tomographic systems suffer from certain drawbacks: (i) the measurement fields are disturbed by the antenna elements placed adjacent to the receiving antenna element, and (ii) the receiving antenna elements cross-talk.…”

Section: Introductionmentioning

confidence: 99%

Millimetre‐wave multi‐view near‐field scattering tomography system

Shahir

Semnani

Mohajer

et al. 2018

IET Microwaves, Antennas & Propagation

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In a previous study by Shahir et al., the permittivity profile of object under test (OUT) from electric fields measured outside OUT is accurately estimated by considering the region of interest confined within the boundary of the OUT. This study proposes a continuous‐wave multi‐view near‐field scattering tomography system at the millimetre‐wave frequency range and reformulates the sub‐space approach for reconstructing the continuous‐wave tomographic images while considering the region of interest beyond the OUT boundary. The OUT reconstructed tomographic images enable one to localise the OUT boundaries. The proposed system also eliminates the need for fully systemic isolation (i.e. anechoic chamber) or water as a background medium by reducing multipath effects substantially at millimetre wave. The system performance is evaluated by reconstructing the tomographic images of various samples, and the experimental results are presented.

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Section: Introductionmentioning

confidence: 99%

Millimetre‐wave multi‐view near‐field scattering tomography system

Shahir

Semnani

Mohajer

et al. 2018

IET Microwaves, Antennas & Propagation

View full text Add to dashboard Cite

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Microwave Tomography

Rubaek¹,

Mohr²

2016

An Introduction to Microwave Imaging for Breast Cancer Detection

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A brief history of the development of the near-field measurement technique at the Georgia Institute of Technology

Joy

1988

IEEE Trans. Antennas Propagat.

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The activity of the Georgia Institute of Technology in the development of the near-field measurement technique is reviewed. The work conducted during the years 1967-1973 is given primary importance, and the major near-field developments in the 1973-1980 time period are also briefly described.HE GEORGIA Institute of Technology has historically T had a strong interest in antenna measurement techniques. Scientific-Atlanta, Inc. is a Georgia Tech spin-off company formed in the mid-1950's to produce instrumentation for antenna measurements. The reflector compact antenna measurement technique was developed at Georgia Tech in the mid-1960's under the leadership of Richard C. Johnson. Georgia Tech was awarded a patent for the compact antenna measurement range in 1967 [l].Also in the mid-l960's, Demetrius T. Paris became interested in the near-field behavior of antennas in his study of radomes, which are often located in the radiating near field of an antenna. He showed that greater accuracy in far-field pattern calculation of an antenna can be achieved using the vector formulation of the diffraction equation which requires knowledge of both the electric and magnetic aperture fields versus the scalar formulation which requires knowledge of only one. These results were published in 1968 [2]. He likewise formulated a radome analysis technique which required knowledge and manipulation of both the electric and magnetic near fields of an antenna, as presented in a 1970 J . Searcy Hollis and Larry Clayton, Jr., of ScientificAtlanta had envisioned the practicality of planar surface nearfield measurements and had performed amplitude and phase near-field measurements of a Ku-band antenna, compared the calculated far-field patterns to measured far-field patterns and published these results as early as 1960 [4]. They used the scalar diffraction integral of the planar surface aperture fields to calculate the far-field pattern of the antenna. The scalar diffraction integral reduces to a Fourier transform of the planar surface aperture fields for far-field determination. Toward this end, Scientific-Atlanta had developed a 100-in by 100-in planar scanner, a phase-amplitude receiver, and a Fourier integral analog computer by 1961. paper ~31.Paris approached Scientific-Atlanta in his search for research support for his graduate student, the writer of this paper, in 1967. The topic of mutual interest was the theory and practical implementation of planar surface near-field measurements. Scientific-Atlanta provided a three-year research assistantship for the writer and donated a 100-in by 100-in planar scanner and associated manual position control unit to Georgia Tech. Over the course of the following three years, Hollis educated the writer in the state of the art in antenna measurement techniques including the pioneering work conducted at Scientific-Atlanta in near-field antenna measurements.The planar scanner was assembled in the basement of the Electronics Research Building of the Georgia Tech Engineering Experiment Station. The basement...

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A Microwave Diffraction Tomography System for Biomedical Applications

Cited by 16 publications

References 12 publications

Millimetre‐wave multi‐view near‐field scattering tomography system

Millimetre‐wave multi‐view near‐field scattering tomography system

Microwave Tomography

A brief history of the development of the near-field measurement technique at the Georgia Institute of Technology

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