2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535)
DOI: 10.1109/mwsym.2004.1339083
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A metric for assessing the degree of device nonlinearity and improving experimental design

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Cited by 3 publications
(4 citation statements)
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“…As was shown in [8], the behavioral model extracted from 20 RF trajectories equidistantly sampled in the r-domain achieved higher accuracy of the third-order intermodulation distortion product prediction than the corresponding model based on 20 temporally-equidistant trajectories. There is however no information about the performance of both models when used to predict different types of signals.…”
Section: Discussionmentioning
confidence: 59%
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“…As was shown in [8], the behavioral model extracted from 20 RF trajectories equidistantly sampled in the r-domain achieved higher accuracy of the third-order intermodulation distortion product prediction than the corresponding model based on 20 temporally-equidistant trajectories. There is however no information about the performance of both models when used to predict different types of signals.…”
Section: Discussionmentioning
confidence: 59%
“…In the nonlinearity metric piecewise uniform sampling method of [8] the RF carrier frequency cycles are selected basing on a nonlinearity metric calculated for many RF periods along the modulation envelope period. A preference is given to the RF periods associated with higher values of the nonlinearity metric, what resulted in an improved behavioral model accuracy [8]. The nonlinearity metric r is defined by (1) as the root-mean-square (RMS) of orthogonal distances between normalized trajectories b 2 ðt q ; t r Þ and the normalized reference (linear) trajectorỹ b 2 ðt q ; t ref Þ…”
Section: B Nonlinearity Metric Piecewise Uniform Approachmentioning
confidence: 99%
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