A methodology to delimit the on-state safe operating area of GaAS MOSFET for non linear applications

Ismaïl, N.; Malbert, Nathalie; Labat, Nathalie; Touboul, A.; Muraro, Jean-Luc

doi:10.1109/ipfa.2005.1469148

Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005.

DOI: 10.1109/ipfa.2005.1469148

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A methodology to delimit the on-state safe operating area of GaAS MOSFET for non linear applications

N. Ismaïl

Nathalie Malbert

Nathalie Labat

et al.

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A methodology to delimit the on-state safe operating area of GaAS MOSFET for non linear applications

Cited by 0 publications

References 14 publications

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