2004 IEEE International Conference on Cluster Computing (IEEE Cat. No.04EX935)
DOI: 10.1109/bmas.2004.1393980
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A methodology for analog circuit macromodeling

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Cited by 9 publications
(2 citation statements)
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“…Macromodeling, starting from an op-amp model in 1974 [31], looks to create a nonlinear model to reproduce circuit responses as close as possible [32] using simpler digital numerical models. Models look to utilize generalized, low-order polynomials around a single fixed operating point [33][34][35][36][37], and some models utilize the nonlinear dynamics of the transistors [29,[38][39][40]. These techniques often are coupled with tool design approach, particularly joint verification of digital and analog systems [41][42][43][44].…”
Section: Level = 2: Enabling Circuit Designers To Build Level = 1 Blocksmentioning
confidence: 99%
“…Macromodeling, starting from an op-amp model in 1974 [31], looks to create a nonlinear model to reproduce circuit responses as close as possible [32] using simpler digital numerical models. Models look to utilize generalized, low-order polynomials around a single fixed operating point [33][34][35][36][37], and some models utilize the nonlinear dynamics of the transistors [29,[38][39][40]. These techniques often are coupled with tool design approach, particularly joint verification of digital and analog systems [41][42][43][44].…”
Section: Level = 2: Enabling Circuit Designers To Build Level = 1 Blocksmentioning
confidence: 99%
“…Difficulties are that faulty behavior may force (nonfaulty) subsystems into highly nonlinear regions of operation, which may not be covered by their models. It is therefore important to understand the mechanism of propagation, so that to identify the order of occurrence of events and specify the paths of fault propagation in causal qualitative models [35] . For HLFM techniques in a system, it is crucial to know whether or not the high level fault-free model (e.g., opamp) is able to correctly model propagation of the faulty behavior, how fault propagation can be predicted so that the suitable model will be selected for the whole system.…”
Section: High Level Fault Modeling and Simulationmentioning
confidence: 99%