1984
DOI: 10.1016/0016-7142(84)90030-9
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A method for calculating mise-à-la-masse anomalies in the case of high conductivity contrast by the integral equation technique

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Cited by 19 publications
(19 citation statements)
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“…It may be thought that since the above equations are essentially the same as the results presented by Eloranta (1984) the technique does not require any further validation. However, the present implementation involves several aspects that are new and so requires evaluation.…”
Section: Discussionmentioning
confidence: 82%
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“…It may be thought that since the above equations are essentially the same as the results presented by Eloranta (1984) the technique does not require any further validation. However, the present implementation involves several aspects that are new and so requires evaluation.…”
Section: Discussionmentioning
confidence: 82%
“…The technique described by Eloranta (1984), on the other hand, can be used with no difficulty. The technique described by Eloranta (1984), on the other hand, can be used with no difficulty.…”
Section: Discussionmentioning
confidence: 99%
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“…The scattering field can be described by a surface distribution of charges or potential on the body that is typically used for electrical resistivity modelling (Dieter, Paterson and Grant 1969;Snyder 1976;Eskola 1979;Hvozdara 1982Hvozdara , 1983Eloranta 1984). The body, within a homogeneous or layered halfspace, has an effect on the potential field which is commonly referred to as the scattering or secondary field.…”
Section: Basic Theorymentioning
confidence: 99%