A Mechanistic Study Identifying Improved Technology Critical Metal Delamination from Printed Circuit Boards at Lower Power Sonications in a Deep Eutectic Solvent

Jacobson, B.; Li, S. K.; Rivera, Rodolfo Marin; Daly, Paul; Elgar, Christopher E.; Mulvihill, Daniel M.; Abbott, Andrew P.; Feeney, Andrew; Prentice, Paul

doi:10.2139/ssrn.4534686

2023

DOI: 10.2139/ssrn.4534686

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A Mechanistic Study Identifying Improved Technology Critical Metal Delamination from Printed Circuit Boards at Lower Power Sonications in a Deep Eutectic Solvent

B. Jacobson

S. K. Li

Rodolfo Marin Rivera

et al.

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A Mechanistic Study Identifying Improved Technology Critical Metal Delamination from Printed Circuit Boards at Lower Power Sonications in a Deep Eutectic Solvent

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