A matrix method for PLD failure localization

Localization of faulty multi-output unit in discrete device

“…As was proved for the single-output blocks in [7], the matrix method of testing enables localization of any multiple fault of blocks if all faulty blocks lie in one row or one column. If this assertion is expanded to DD with multi-output blocks, the following is true.…”

“…The matrix method of localizing a faulty single-output block proposed in [7] was expanded to DD with multi-output blocks. It was shown that any multi-output block will be necessarily localized in the class of the single faulty block if the outputs of each block are all in one row or one column of the matrix.…”

“…A matrix method of fault localization in DD consisting only of single-output blocks was proposed in [7]. It is capable to localize the faulty block and requires less amount of the testing hardware.…”

“…The DD realized in FPGA and having only the single-output blocks in the form of configurable FPGA logic block was considered in [7]. In what follows, we consider a DD consisting of multioutput blocks having different numbers of outputs denoted by n i , where i is the number of a block.…”

“…The designers of the testing systems are always aiming at reducing all cost, time, hardware overhead. This paper discusses the question of reducing the size of the testing hardware intended to analyze the test response and is a continuation of the authors paper [7].…”