1992
DOI: 10.1149/1.2069155
|View full text |Cite
|
Sign up to set email alerts
|

A Mathematical Model for the Influence of Deep‐Level Electronic States on Photoelectrochemical Impedance Spectroscopy: I . Theoretical Development

Abstract: photocatalytic efficiency of different TiO2 powders used in photoassisted oxidation processes may have its origin in their different distribution of surface traps, where electrons are immobilized and from which electrons are transferred to oxygen. Materials with high densities of shallow (-0.1-0.3 eV) traps are likely to be most effective. However, catalysis of 02 reduction by group VIII metals should in all cases substantially increase the quantum efficiency of the photoassisted oxidation of organics by molec… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
12
0

Year Published

1993
1993
2016
2016

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 19 publications
(13 citation statements)
references
References 14 publications
1
12
0
Order By: Relevance
“…For samples AT-II and AT-I the Mott-Schottky plots are non-linear in the entire potential region. This behavior is commonly observed for amorphous films and when the potential drop applied is divided between the space charge region and an insulating outer film [45][46][47]. The surface film on sample AT-II and AT-I is indeed invisible in X-ray diffraction, see Section 3.1.2, while the thin film on reference A shows some crystallinity.…”
Section: Impedance Spectroscopy and Mott-schottky Analysismentioning
confidence: 67%
“…For samples AT-II and AT-I the Mott-Schottky plots are non-linear in the entire potential region. This behavior is commonly observed for amorphous films and when the potential drop applied is divided between the space charge region and an insulating outer film [45][46][47]. The surface film on sample AT-II and AT-I is indeed invisible in X-ray diffraction, see Section 3.1.2, while the thin film on reference A shows some crystallinity.…”
Section: Impedance Spectroscopy and Mott-schottky Analysismentioning
confidence: 67%
“…When a capacitance measurement method is used, some nonlinearity (smooth bending) has been observed in the Mott-Schottky plot of a thin passive oxide film. 45,46 It has been suggested that the nonlinearity is due to amorphous or highly disordered and nonstoichiometric structure of passive films. 47 However, the deviation seen in this investigation does not appear to be the same as the commonly observed nonlinearity for a thin oxide film, and the origin for this deviation is not clear.…”
Section: Tio 2 Film On Stainless Steelmentioning
confidence: 99%
“…The potential drop over the oxide can be divided into two parts: one takes place over the less conducting outer part of the oxide and the other over the more conducting part closer to the metal/oxide interface [3739]. Close to the flat band potential, most of the potential drop takes place over the insulating part, and it is possible to calculate the part of the potential, that is, used to establish the space charge region in the semiconducting part of the oxide [38].…”
Section: Resultsmentioning
confidence: 99%