1989
DOI: 10.1109/66.24928
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A machine-learning classification approach for IC manufacturing control based on test structure measurements

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Cited by 16 publications
(3 citation statements)
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“…While the use of machine learning in production research dates to 1980s (e.g. Lu and Ham 1989;Shaw and Whinston 1989;Zaghloul et al 1989), it has begun to gain acceptance in recent years. Machine learning algorithms can process symbolic data (e.g.…”
Section: Machine Learning In Production Systemsmentioning
confidence: 99%
“…While the use of machine learning in production research dates to 1980s (e.g. Lu and Ham 1989;Shaw and Whinston 1989;Zaghloul et al 1989), it has begun to gain acceptance in recent years. Machine learning algorithms can process symbolic data (e.g.…”
Section: Machine Learning In Production Systemsmentioning
confidence: 99%
“…In this category, one may classify the following systems: decision tree induction [29], learning with genetic algorithms [81] similruity-based learning [145,139], CLUSTERJ2 [139], ID3 [175] and the classification approach for IC manufacturing control [229]. In this category, one may classify the following systems: decision tree induction [29], learning with genetic algorithms [81] similruity-based learning [145,139], CLUSTERJ2 [139], ID3 [175] and the classification approach for IC manufacturing control [229].…”
Section: In Learning From Examples a Set Of Examples And Counter Examentioning
confidence: 99%
“…Machine learning classification models find various applications in manufacturing industries. Zaghloul et al [5] used machine learning classification approach for classifying electrical measurement results from a custom-designed test chip. Kim et al [6] trained the models with Fault Detection and Classification (FDC) data for detection of the faulty wafer in semiconductor manufacturing process.…”
Section: Introductionmentioning
confidence: 99%