This chapter surveys the basic concepts, experimental conditions, modes of operation, tip preparation, and the contrast mechanisms of two magnetic‐sensitive scanning probe techniques, that is, magnetic force microscopy (MFM) and spin‐polarized scanning tunneling microscopy (SP‐STM). The strength and limitations of these imaging techniques are exemplified by presenting results obtained on numerous sample systems including magnetic hard disks, epitaxial surfaces, and nanoparticles at various temperatures and external fields.