2015 IEEE 58th International Midwest Symposium on Circuits and Systems (MWSCAS) 2015
DOI: 10.1109/mwscas.2015.7282022
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A low-power temperature-compensated relaxation oscillator for built-in test signal generation

Abstract: An on-chip frequency reference for built-in testing and calibration applications is presented. The design combines a proportional-to-absolute-temperature (PTAT) current reference and a relaxation oscillator core. A temperature compensation scheme is realized based on the thermal voltage, for which simulations indicate low sensitivity to process variations. The oscillator was designed and simulated in a 130nm CMOS process with a power supply of 1.2V. It generates a 40KHz output and occupies a layout area of 0.0… Show more

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Cited by 7 publications
(1 citation statement)
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“…Hence, it may not be suitable for providing a stable clock using the standalone ring oscillator topology. Several reported works [7][8][9][10][11] have shown that the relaxation oscillator can provide a good tradeoff between frequency stability, temperature variation, and supply variation while occupying at reasonably small area. Thus, the relaxation oscillator is preferred as on-chip oscillator for those applications that require good stability with low cost and moderate precision.…”
Section: Introductionmentioning
confidence: 99%
“…Hence, it may not be suitable for providing a stable clock using the standalone ring oscillator topology. Several reported works [7][8][9][10][11] have shown that the relaxation oscillator can provide a good tradeoff between frequency stability, temperature variation, and supply variation while occupying at reasonably small area. Thus, the relaxation oscillator is preferred as on-chip oscillator for those applications that require good stability with low cost and moderate precision.…”
Section: Introductionmentioning
confidence: 99%