Abstract:This paper presents a pulse response-based builtin self test technique and implementation for the testing of analog integrated circuits in mixed-signal systems. This BIST technique employs two narrow width pulses as input stimuli, and monitors two voltage samples on pulse response waveform for fault detection through allowable tolerances. The BIST system implementation realizes a programmable delay line for generating pulse stimuli, and a sample-and-hold circuit with comparators for fault detection process. De… Show more
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