A low-cost experimental test bench for electronic power devices

Abstract

A low-cost experimental test bench is proposed to test electronic power devices such as Diode, MOSFET, and JFET. This bench is based on the dc-dc converter. This latter controls the applied voltage and current. The proposed experimental bench consists to test devices in various types of dc-dc converter according to the current and voltage levels required. Experimental measurements of the new silicon carbide JFET device, for example, are presented and discussed.