2003
DOI: 10.1109/tcapt.2003.817654
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A life consumption monitoring methodology for electronic systems

Abstract: Failures in electronic products are often attributable to various combinations, intensities, and durations of environmental loads, such as temperature, humidity, vibration, and radiation. For many of the failure mechanisms in electronic products, there are models that relate environmental loads to the time to failure of the product. Thus, by monitoring the environment of a product over its life cycle, it may be possible to determine the amount of damage induced by various loads and predict when the product mig… Show more

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Cited by 130 publications
(43 citation statements)
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References 11 publications
(34 reference statements)
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“…Life Consumption Models were first proposed by Ramakrishnan and Pecht (2003) for monitoring RUL in electronic systems. The LCM methodology monitors the environment of a component or system during its entire lifecycle to determine the amount of damage incurred through the various loads and conditions experienced.…”
Section: Life Consumption Modelsmentioning
confidence: 99%
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“…Life Consumption Models were first proposed by Ramakrishnan and Pecht (2003) for monitoring RUL in electronic systems. The LCM methodology monitors the environment of a component or system during its entire lifecycle to determine the amount of damage incurred through the various loads and conditions experienced.…”
Section: Life Consumption Modelsmentioning
confidence: 99%
“…The incurred damage is estimated through physics-of-failure models; this damage amount is related to a fraction of life lost by considering the total amount of operation under the same conditions, which would result in failure of an undamaged part. LCM is illustrated in Ramakrishnan and Pecht (2003) and Mishra et al's (2004) papers by application to a mounted printed circuit board operated under the hood of a moving vehicle. Both temperature and vibration levels were monitored on the board during use.…”
Section: Life Consumption Modelsmentioning
confidence: 99%
“…PoF-based prognostic methodologies have been applied to estimate RUL in electronic assemblies and components such as power supply chips on a DC/DC voltage converter printed circuit board (PCB) assembly 13) ; PCBs subjected to loads under an automobile hood 14), 15) ; electronics subjected to thermo-mechanical loads 16) ; and for monitoring, recording, and analyzing the life cycle vibration loads for estimation of the RUL of PCBs using cumulative damage laws. 17) A PoF-based tool has been developed for real time prediction of RUL of PCBs exposed to thermal cycling environments.…”
Section: )-12) Thementioning
confidence: 99%
“…An example of a combined prognostics architecture is the life consumption monitoring (LCM) methodology introduced by Ramakrishnand and Pecht 21 .…”
Section: Combined Prognostics Model Typesmentioning
confidence: 99%