2020
DOI: 10.15199/48.2020.04.21
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A hybrid device for the acquisition of electrical tomography measurement data

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“…The sprayed material not only settles in the vicinity of the vapor source but partially reaches the substrate, damaging the thin film [ 1 ]. The quality of the deposited layer can be assessed using optical microscopy or computed tomography [ 13 , 14 ]. The geometric shape of such layers can be changed using a laser beam [ 15 ].…”
Section: Introductionmentioning
confidence: 99%
“…The sprayed material not only settles in the vicinity of the vapor source but partially reaches the substrate, damaging the thin film [ 1 ]. The quality of the deposited layer can be assessed using optical microscopy or computed tomography [ 13 , 14 ]. The geometric shape of such layers can be changed using a laser beam [ 15 ].…”
Section: Introductionmentioning
confidence: 99%