2016 IEEE MTT-S Latin America Microwave Conference (LAMC) 2016
DOI: 10.1109/lamc.2016.7851268
|View full text |Cite
|
Sign up to set email alerts
|

A holistic methodology for system margining and jitter tolerance optimization in post-silicon validation

Abstract: The optimization of receiver analog circuitry in modern high-speed input/output (HSIO) links is a very time consuming post-silicon validation process. Current industrial practices are based on exhaustive enumeration methods to improve either the system margins or the jitter tolerance compliance test. In this paper, these two requirements are addressed in a holistic optimization-based approach. We propose an innovative objective function based on these two metrics. Our method employs Kriging to build a surrogat… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
19
0

Year Published

2017
2017
2020
2020

Publication Types

Select...
6
1

Relationship

6
1

Authors

Journals

citations
Cited by 12 publications
(20 citation statements)
references
References 8 publications
1
19
0
Order By: Relevance
“…The measurement system is based in the system margin validation (SMV) process [4], [38], which is a methodology to verify the signal integrity of a circuit board and assess how much margin is in the design relative to silicon characteristics and processes. The SMV methodology consists of measuring the Rx functional eye width and eye height by using on-die design for test (DFT) features until the eye opening has been shrunk to a point where the Rx detects errors or the system fails [6].…”
Section: Experimental System Configuration and Doe Approachesmentioning
confidence: 99%
See 3 more Smart Citations
“…The measurement system is based in the system margin validation (SMV) process [4], [38], which is a methodology to verify the signal integrity of a circuit board and assess how much margin is in the design relative to silicon characteristics and processes. The SMV methodology consists of measuring the Rx functional eye width and eye height by using on-die design for test (DFT) features until the eye opening has been shrunk to a point where the Rx detects errors or the system fails [6].…”
Section: Experimental System Configuration and Doe Approachesmentioning
confidence: 99%
“…Tunable elements are proposed to adjust the analog circuit performance after chip fabrication [2], [3]. These tunable elements provide a way to reconfigure high-speed input/output (HSIO) links in post-silicon servers to mitigate the effects of system channels' variability [4], as illustrated in Fig. 1.…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…On the other hand, postsilicon tuning has been widely adopted to confront the silicon process variation. Tunable elements are proposed to adjust the analog circuit performance after chip fabrication [4], [5], allowing to reconfigure I/O links to cancel the effects of system channels' variability [6]. PHY tuning settings include: parameters of an equalizer at the Tx, Rx, or both; the clock and data recovery circuit settings; variable gain amplifiers; baud-spaced FFE in the Tx, and the bias voltages or currents values, among others [7].…”
Section: Post-silicon Phy Tuningmentioning
confidence: 99%