A Highly Automated and Rapid Datasheet Driven Empirical Modeling Process of SiC MOSFETs with High Accuracy and Robust Convergence

Rao, Zhenbo; Wang, Yan

doi:10.1109/asicon58565.2023.10396547

2023 IEEE 15th International Conference on ASIC (ASICON) 2023

DOI: 10.1109/asicon58565.2023.10396547

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A Highly Automated and Rapid Datasheet Driven Empirical Modeling Process of SiC MOSFETs with High Accuracy and Robust Convergence

Zhenbo Rao,

Yan Wang

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A Highly Automated and Rapid Datasheet Driven Empirical Modeling Process of SiC MOSFETs with High Accuracy and Robust Convergence

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References 12 publications

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