A Higher Radix Technique for Fault Detection in Many-Valued Multithreshold Networks

Druzeta,; Vranesic,

doi:10.1109/tc.1978.1674999

Cited by 5 publications

(1 citation statement)

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“…6 ' 11 The accepted approach is simply to replace each binary logic circuit by its multivalued logic circuit equivalent. In this case, otherwise surplus logic values can be used either to detect faults within the circuit or to simplify the method of fault detection.…”

Section: Introductionmentioning

confidence: 99%

Self-checking binary logic systems using ternary logic circuits

Smith

1984

Can. Electr. Eng. J.

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The present status of multivalued logic is highlighted in a Canadian context. A particular example is given of the use of ternary circuits in the solution of the problem of testability of binary logic, through the introduction of a new concept called 2-of-3-valued logic. Its application to the design of combinational and sequential self-checking systems is demonstrated. Keywords in this paper include: multivalued logic, testability, reliability, ternary logic, CMOS logic, and fault tolerance. La situation présente de la logique à valeurs multiples est mise en relief dans un contexte canadien. Un exemple particulier est donné sur l'utilisation de circuits ternaires dans la solution de problème de la possibilité de contrôle de la logique binaire par le biais de l'introduction d'un nouveau concept appelé logique à valeur 2-de-3. Une démonstration est faite de son application au design de systèmes combinatoires et séquentiels à auto-vérification. Dans cette étude, les mots-clés comprennent: logique à valeurs multiples, possibilité de contrôle, fiabilité, logique ternaire, logique MOS complémentaire, et insensibilité aux défaillances.

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Section: Introductionmentioning

confidence: 99%