2023
DOI: 10.3390/mi14051069
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A High-Sensitivity MEMS Accelerometer Using a Sc0.8Al0.2N-Based Four Beam Structure

Abstract: In this paper, a high-sensitivity microelectromechanical system (MEMS) piezoelectric accelerometer based on a Scandium-doped Aluminum Nitride (ScAlN) thin film is proposed. The primary structure of this accelerometer is a silicon proof mass fixed by four piezoelectric cantilever beams. In order to enhance the sensitivity of the accelerometer, the Sc0.2Al0.8N piezoelectric film is used in the device. The transverse piezoelectric coefficient d31 of the Sc0.2Al0.8N piezoelectric film is measured by the cantilever… Show more

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Cited by 4 publications
(2 citation statements)
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“…The stress difference on the two surfaces of the cantilever beam leads to the distribution of charges between the two surfaces, as shown in Figure 2 . In this structure, there are two piezoelectric units connected in series, one lower electrode and two disconnected upper electrodes [ 31 ].…”
Section: Theoreticalmentioning
confidence: 99%
“…The stress difference on the two surfaces of the cantilever beam leads to the distribution of charges between the two surfaces, as shown in Figure 2 . In this structure, there are two piezoelectric units connected in series, one lower electrode and two disconnected upper electrodes [ 31 ].…”
Section: Theoreticalmentioning
confidence: 99%
“…MEMS accelerometers have been widely used in consumer electronics, industrial control, energy exploration, and aerospace fields due to their small size, low cost, low power consumption, easy integration, and massive production [ 1 , 2 ]. Compared to piezoresistive [ 3 ], piezoelectric [ 4 , 5 ], and capacitive [ 6 ] accelerometers, micromachined resonant accelerometers (MRAs) have the characteristics of high sensitivity, large dynamic range, and strong anti-interference ability [ 7 , 8 ]. Therefore, they have a good application prospect.…”
Section: Introductionmentioning
confidence: 99%