2018
DOI: 10.1149/2.0211804jss
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A High Reliable High-κ Antifuse Programmed by Intrinsic Overshoot Current

et al.

Abstract: In this paper, we fabricated a W/Al 2 O 3 /Ti metal-insulator-metal (MIM) antifuse one-time programmable memory. A large current overshoot was observed during the dielectric breakdown, which generated a strong conductive filament and resulted in extremely low on-state resistance. The performance of this Al 2 O 3 -based antifuse has been demonstrated with an ultra large ON/OFF window on the order of 10 12 . Both breakdown voltage and on-state resistance exhibit excellent uniformity, the off-state lifetime is pr… Show more

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Cited by 2 publications
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“…We have reported the programming characteristics of Al 2 O 3 based antifuse with Ti electrode. 6 There exists an overshoot current in this structure during programming and we take advantage of this large current acting as programming current and obtained extreme low resistance. The overshoot current can be indicated in the reset current-voltage curves of on-state antifuse.…”
Section: Resultsmentioning
confidence: 99%
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“…We have reported the programming characteristics of Al 2 O 3 based antifuse with Ti electrode. 6 There exists an overshoot current in this structure during programming and we take advantage of this large current acting as programming current and obtained extreme low resistance. The overshoot current can be indicated in the reset current-voltage curves of on-state antifuse.…”
Section: Resultsmentioning
confidence: 99%
“…Metal-Insulator-Metal antifuse has been extensively used in field programmable gate arrays (FPGA's) as interconnect elements and programmable read-only memory (PROM) as one-time programmable memory. [1][2][3][4] We have fabricated a new antifuse based on high-κ material Al 2 O 3 deposited by atomic layer deposition, 5 explored the unique programming characteristics, 6 and investigated the properties of conductive filament within Al 2 O 3 dielectric after antifuse was broken down. 7 The bottom and top metal that close to the antifuse layer is extremely important to influence the characteristics of the device.…”
mentioning
confidence: 99%
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